Narrow and Ultranarrow Transitions in Highly Charged Xe Ions as Probes of Fifth Forces
Rehbehn Nils-Holger, Rosner Michael K., Berengut Julian C. (BEV), Schmidt Piet O., Pfeifer Thomas, Gu Ming Feng, López-Urrutia José R. CrespoHighly Charged Ions, New Physics Searches
| Document type | Article |
| Journal title / Source | Physical Review Letters |
| Volume | 131 |
| Issue | 16 |
| Publisher's name | American Physical Society (APS) |
| Publisher's address (city only) | Hauppauge, NY, United States |
| Publication date | 2023-10-17 |
| ISSN | 0031-9007, 1079-7114 |
| DOI | 10.1103/PhysRevLett.131.161803 |
| Language | English |