Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths
Ridler N., Susan Johny A., Salter M., Shang X., Sun W., Wilson A.metrological traceability, vector network analyser, calibration, waveguide, sub-millimetre-wave measurements, scattering parameters
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 58 |
| Issue | 1 |
| Page numbers / Article number | 1-13 |
| Publisher's name | IOP Publishing |
| Publication date | 2020-12-14 |
| ISSN | 0026-1394, 1681-7575 |
| DOI | 10.1088/1681-7575/abd371 |
| Language | English |