New metrology for radon at the environmental level
Röttger A., Röttger S., Grossi C., Vargas A., Curcoll R., Otáhal P., Hernández-Ceballos M.Á., Cinelli G., Chambers S., Barbosa S.A., Ioan M-R., Radulescu I., Kikaj D., Chung E., Arnold T., Yver Kwok C., Fuente M., Mertes F., Morosh V.radon, metrology, tracer, environmental measurements
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Publisher's name | IOP Publishing |
| Publication date | 2021-9-23 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ac298d |
| Language | English |