Bringing real-time traceability to high-speed atomic force microscopy
Heaps E., Yacoot A., Dongmo H., Picco L., Payton O.D., Russell-Pavier F.S, Korpelainen V., Klapetek PMetrology, high-speed atomic force microscopy, traceability, nanometrology, nanotechnology
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Publisher's name | IOP Publishing |
| Publication date | 2020-3 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ab7ca9 |
| Language | English |