On the optical constants of cobalt in the M-absorption edge region
Saadeh Qais, Laubis Christian, Babuschkin Anja, Mentzel Heiko, García Danilo Ocaña, Abdulhadi Yasser, Salami Zanyar, Buchholz Christian, Scholze Frank, Philipsen Vicky, Wu Meiyi, Thakare Devesh, Naujok Philipp, Soltwisch VictorEUV-reflectometry, thin film metrology, optical constants, absorption edge
| Document type | Article |
| Journal title / Source | Optik |
| Volume | 273 |
| Page numbers / Article number | 170455 |
| Publisher's name | Elsevier BV |
| Publisher's address (city only) | Amsterdam, NX, Netherlands |
| Publication date | 2023-2 |
| ISSN | 0030-4026 |
| DOI | 10.1016/j.ijleo.2022.170455 |
| Language | English |