SPICE simulation of the time-dependent clustering model for dielectric breakdown
Salvador E., Rodriguez R., Miranda E.dielectrical breakdown
| Document type | Article |
| Journal title / Source | Solid-State Electronics |
| Volume | 215 |
| Page numbers / Article number | 108895 |
| Publisher's name | Elsevier BV |
| Publisher's address (city only) | Amsterdam, NX, Netherlands |
| Publication date | 2024-5 |
| ISSN | 0038-1101 |
| DOI | 10.1016/j.sse.2024.108895 |
| Language | English |