Reliable mmWave On-Wafer Measurement from Lab to Factory Floor
Shang X., Ridler N., Tucker A., Williams T.on-wafer measurement, introductory guide, reliable, mmwave, planar circuits, s-parameters, knowledge transfer, metrology labs, NPL, Filtronic, PlanarMet, PlanarCal, User Guide, EMPIR
| Document type | Article |
| Journal title / Source | Microwaves & RF |
| Volume | Test & Mea |
| Issue | April 2022 |
| Page numbers / Article number | 1-5 |
| Publisher's name | Microwave & RF |
| Publication date | 2022-4 |
| ISSN | 7452993 |
| Web URL | https://www.mwrf.com/technologies/test-measurement/document/21237918/reliable-mmwave-onwafer-measurement-from-lab-to-factory-floor-download |
| Language | English |
| Persistent Identifier | https://www.mwrf.com/technologies/test-measurement/article/21237915/filtronicreliable- mmwave-onwafer-measurement-from-lab-to-factory-floor |