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Silicon double spring for the simultaneous calibration of probing forces and deflections in the micro range

Brand U., Li Z., Gao S., Hahn S., Hiller K.
Keywords:

double spring, probing force calibration, bending force, bending deflection, stiffness

Document type Article
Journal title / Source Measurement Science and Technology
Peer-reviewed article 1
Volume 27
Issue 2016
Page numbers / Article number 015601 / 9 pp
Publisher's name IOP Publishing Ltd.
Publisher's address (city only) UK
Publication date 2015-11-24
DOI 10.1088/0957-0233/27/1/015601
Language English

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Information

Name of Call / Funding Programme
EMRP A169: Call 2011 Metrology for New Technologies