Millimeter-wave and Terahertz Power Meter Characterisation at W-band Frequencies
Stokes Daniel, Liu Yu, Shang Xiaobang, Ridler Nick M.Calibration, mm-wave power, Terahertz power, Measurement uncertainty, Calorimetry, Traceability
Document type | Article |
Journal title / Source | Journal of Infrared, Millimeter, and Terahertz Waves |
Volume | N/A |
Issue | N/A |
Publisher's name | Springer Science and Business Media LLC |
Publication date | 2023-1-25 |
ISSN | 1866-6892, 1866-6906 |
DOI | 10.1007/s10762-022-00898-8 |
Web URL | https://rdcu.be/c4a8S |
Language | English |