Event-Driven Stochastic Compact Model for Resistive Switching Devices
Suñé J., Bargalló-González M., Saludes M., Campabadal F., Miranda E.resistive switching, modeling
| Document type | Article |
| Journal title / Source | IEEE Transactions on Electron Devices |
| Page numbers / Article number | 1-6 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2024 |
| ISSN | 0018-9383, 1557-9646 |
| DOI | 10.1109/TED.2024.3414370 |
| Language | English |