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Thin-film microsusceptometer with integrated nanoloop

Drung D, Storm J. H., Ruede F, Kirste A, Regin M, Schurig T, Repollés A. M., Sesé J, Luis F
Keywords:

thin film, microsusceptometers, nanoloops

Document type Proceedings
Journal title / Source IEEE 14th International Proceedings of Superconductive Electronics Conference
Peer-reviewed article 1
Volume n/a
Issue n/a
Page numbers / Article number 1-3
Publisher's name IEEE
Publisher's address (city only) New York
Publication date 2013-7-20
Conference name IEEE 14th International Proceedings of Superconductive Electronics Conference
Conference date 7-11 July 2013
Conference place Cambridge, MA
ISSN n/a
DOI 10.1109/ISEC.2013.6604262
ISBN 978-1-4673-6369-3
Web URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6604262&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F6598362%2F6604250%2F06604262.pdf%3Farnumber%3D6604262
Language English

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Information

Name of Call / Funding Programme
EMRP A169: Call 2011 Metrology for New Technologies