Uncertainty Evaluation of an Alternative Conducted Emission Test Method
Zhao D., Cakir S., Sen O.Alternative test method, ATM, conducted emission
Document type | Proceedings |
Journal title / Source | Proceeding of the 7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition (APEMC 2016) |
Peer-reviewed article | 1 |
Volume | 1 |
Issue | 1 |
Page numbers / Article number | WE-PM-I-TC02-6 |
Publisher's name | APEMC |
Publication date | 2016 |
Conference name | The 7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition (APEMC 2016) |
Conference date | 18-05-2016 to 21-05-2016 |
Conference place | Shenzhen, China |
DOI | 10.1109/APEMC.2016.7522905 |
ISBN | 978-1-4673-9494-9 |
Web URL | http://ieeexplore.ieee.org/document/7522905/?arnumber=7522905&tag=1 |
Language | English |