The gateway to Europe's
integrated metrology community.

Use of reference limits in the Feature Selective Validation (FSV) method

Jauregui Ricardo, Pous Marc, Silva Ferran
Keywords:

Feature Selective Validation method (FSV), Validation, Data comparison, Computational Electromagnetics (CEM), Computer simulation, Numerical simulation, reference limits.

Document type Article
Journal title / Source 2014 International Symposium on Electromagnetic Compatibility
Peer-reviewed article 1
Volume 1
Issue 1
Page numbers / Article number 1031-1036
Publisher's name IEEE
Publisher's address (city only) Gothenburg
Publication date 2014
ISSN 2325-0356
DOI 10.1109/EMCEurope.2014.6931054
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6931054&isnumber=6930855
Language English
Persistent Identifier 14696931

Back to the list view

Information

Name of Call / Funding Programme
EMRP A169: Call 2012 Metrology for Industry (II)