Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration
Wang Yi, Shang Xiaobang, Ridler Nick M., Naftaly Mira, Dimitriadis Alexandros I., Huang Tongde, Wu WenLoss tangent, millimeter-wave measurements, relative permittivity, terahertz measurements, time-domain spectrometer (TDS), thru-reflect-line (TRL) calibration, vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Terahertz Science and Technology |
| Volume | 10 |
| Issue | 5 |
| Page numbers / Article number | 466-473 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication date | 2020-9 |
| ISSN | 2156-342X, 2156-3446 |
| DOI | 10.1109/TTHZ.2020.2999631 |
| Language | English |