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Quantum yield in induced-junction silicon photodiodes at wavelengths around 400 nm

Werner L., Linke U., Müller I., Kubarsepp T., Sildoja M-M., Tran T., Gran J.
Keywords:

silicon photodetector, quantum yield, induced-junction, predictable quantum efficient detector, trap detector, radiometry

Document type Article
Journal title / Source Metrologia
Volume 61
Issue 3
Page numbers / Article number 035002
Publisher's name IOP Publishing
Publisher's address (city only) Bristol, United Kingdom
Publication date 2024-4
ISSN 0026-1394, 1681-7575
DOI 10.1088/1681-7575/ad310d
Language English

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Information

Name of Call / Funding Programme
Metrology Partnership 2022: Integrated European Metrology