VNA tools II: Calibrations involving eigenvalue problems
Wollensack M., Hoffmann J., Stalder D., Ruefenacht J.Vector Network Analyzer, S-parameters, Calibration, Uncertainty, Traceability
| Document type | Proceedings |
| Journal title / Source | 2017 89th ARFTG Microwave Measurement Conference (ARFTG) |
| Volume | 1 |
| Issue | 1 |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publication date | 2017-6 |
| Conference name | Wollensack, Michael, et al. |
| Conference date | 09-06-2017 to 10-06-2017 |
| Conference place | Honolulu |
| DOI | 10.7795/EMPIR.14IND02.CA.20190404 |
| ISBN | 978-1-5386-2748-8 |
| Web URL | http://dx.doi.org/10.1109/ARFTG.2017.8000832 |
| Language | English |