Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique
Wang Y., Shang X., Ridler N.M., Huang T., Wu W.Dielectric constant, dielectric measurements, free-space measurement, loss tangent, millimeter-wave measurements, vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 69 |
| Issue | 7 |
| Page numbers / Article number | 4930-4939 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication date | 2020-7 |
| ISSN | 0018-9456, 1557-9662 |
| DOI | 10.1109/TIM.2019.2954010 |
| Language | English |