Infrared spectrometric measurement of impurities in highly enriched ‘Si28’
Zakel S., Wundrack S., Niemann H., Rienitz O., Schiel D.Infrared spectrometric measurement, Silicon, Avogadro constant
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 48 |
| Issue | 2 |
| Publication date | 2011 |
| DOI | 10.1088/0026-1394/48/2/S02 |