Advanced Computed Tomography for dimensional and surface measurements in industry
Short Name: AdvanCT, Project Number: 17IND08
Enhancing the quality and efficiency of industrial CT measurements
Computed tomography (CT) scans are moving out of hospitals and into factories. Advances in the technique mean that it can increasingly be used to measure product dimensions and surface features.
While industrial CT measurement remains time consuming and prone to considerable error, it can simultaneously evaluate both the complete inner and outer geometry of a sample without causing it any damage. This could substantially improve product development and quality control, but quicker and more accurate techniques are needed to provide practical CT scanning that can be integrated into production lines.
This project will significantly enhance the quality and efficiency of measurements performed using CT.
By correcting geometry errors by 9 degrees of freedom and those originating in the X-ray tube and detector, the project will improve CT accuracy by a factor of 2-8. It will also produce fast CT methods to reduce measurement time to a few minutes or less, greatly benefiting advanced manufacturing in areas such as the automotive, aerospace, and telecoms industries.
Applied Physics
Proceedings 11th Conference on Industrial Computed Tomography (iCT) 2022,
Proceedings 11th Conference on Industrial Computed Tomography (iCT) 2022,
Additive Manufacturing
Proceedings 11th Conference on Industrial Computed Tomography (iCT) 2022,
Proceedings 11th Conference on Industrial Computed Tomography (iCT) 2022,
Sensors
Precision Engineering
Proceedings 21st euspen International Conference and Exhibition
International Journal of Automation Technology
Journal of Parallel and Distributed Computing
Proceedings 20th euspen International Conference and Exhibition
Proceedings of the 10th Conference on Industrial Computed Tomography (iCT) 2020
Mathematics
Proceedings of the 10th Conference on Industrial Computed Tomography (iCT) 2020
Journal of Parallel and Distributed Computing
Nondestructive Testing