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integrated metrology community.
Selected Research Topics (SRTs) for EMRP Call 2012 - Industry
| SRT Number | SRT Title | Result |
|---|---|---|
| SRT-i01 | Traceable stability measurement of protein pharmaceuticals | Not funded |
| SRT-i02 | Chemical metrology tools for manufacture of advanced biomaterials in the medical device industry | Funded as IND56 |
| SRT-i03 | Metrology for long lifetime flexible large area electronics | Not funded |
| SRT-i04 | Large volume metrology in industry | Funded as IND53 |
| SRT-i05 | Traceable in-process dimensional measurement | Funded as IND62 |
| SRT-i06 | Traceable Critical Dimension metrology of engineered nanodevices | Not funded |
| SRT-i07 | Metrology for movement and positioning in six degrees of freedom | Funded as IND58 |
| SRT-i08 | Multi-sensor metrology for microparts in innovative industrial products | Funded as IND59 |
| SRT-i09 | Sustainable electrical machines and devices with reduced rare earth content | Not funded |
| SRT-i10 | Improved EMC test methods in industrial environments | Funded as IND60 |
| SRT-i11 | Metrology for optical and RF communication systems | Funded as IND51 |
| SRT-i12 | Metrology for industrial flow metering | Not funded |
| SRT-i13 | Metrology for processing materials with high natural radioactivity | Funded as IND57 |
| SRT-i14 | Development of novel non-destructive evaluation techniques and procedures for defect detection in composite structures | Not funded |
| SRT-i15 | Metrology to enable high temperature erosion testing | Funded as IND61 |
| SRT-i16 | Novel electronic devices based on control of strain at the nanoscale | Funded as IND54 |
| SRT-i17 | Metrology for airborne molecular contamination in manufacturing environments | Funded as IND63 |
| SRT-i18 | Metrology to support bioprocessing quality-by-design | Not funded |
| SRT-i19 | Nanoscale probing of transport across interfaces | Not funded |
| SRT-i20 | Sustainable components through combining plasticity size effects | Not funded |
| SRT-i21 | Multidimensional reflectometry for industry | Funded as IND52 |
| SRT-i22 | Wavefont metrology for the characterisation of optical systems in industry | Not funded |
| SRT-i23 | Metrology for surface waves and surface state-assisted devices | Not funded |
| SRT-i24 | Compact microwave clocks for industrial applications | Funded as IND55 |
Selected Research Topics (SRTs) for EMRP Call 2012 - SI Broader Scope
| SRT Number | SRT Title | Result |
|---|---|---|
| SRT-s01 | Realisation, dissemination and application of the unit watt in airborne sound | Funded as SIB56 |
| SRT-s02 | Optical standards for the traceable characterisation of dynamic pressure fields | Not funded |
| SRT-s03 | Quantum resistance metrology based on graphene | Funded as SIB51 |
| SRT-s04 | Traceable metrology for high frequency power in the millimetre-wave range | Not funded |
| SRT-s05 | A quantum standard for sampled electrical measurements | Funded as SIB59 |
| SRT-s06 | Metrology for new electrical measurement quantities in high-frequency circuits | Funded as SIB62 |
| SRT-s07 | Automated impedance metrology extending the quantum toolbox for electricity | Funded as SIB53 |
| SRT-s08 | Traceability of gas flow measurements for special applications | Not funded |
| SRT-s09 | Metrology for long distance surveying | Funded as SIB60 |
| SRT-s10 | Angle metrology | Funded as SIB58 |
| SRT-s11 | Optical bidirectional measurements | Not funded |
| SRT-s12 | Crystalline and self-assembled structures as length standards | Funded as SIB61 |
| SRT-s13 | Outgassing rate control and pascal realisation in the extremely low-pressure range | Not funded |
| SRT-s14 | Force traceability within the meganewton range | Funded as SIB63 |
| SRT-s15 | Traceable small force metrology | Not funded |
| SRT-s16 | Metrology for organic chemical calibrators | Not funded |
| SRT-s17 | Traceability for biologically relevant molecules and entities | Funded as SIB54 |
| SRT-s18 | Traceable camera-based photometry and radiometry | Not funded |
| SRT-s19 | New primary standards and traceability for radiometry | Funded as SIB57 |
| SRT-s20 | International timescales with optical clocks | Funded as SIB55 |
| SRT-s21 | Metrology for thermal protection materials | Funded as SIB52 |
| SRT-s22 | Thermophysical metrology at the micro and nano scale | Not funded |
| SRT-s23 | Metrology for moisture in materials | Funded as SIB64 |
Selected Research Topics (SRTs) for EMRP Call 2012 - Open Excellence
| SRT Number | SRT Title | Result |
|---|---|---|
| SRT-x1 | Spintronics and spin-caloritronics in magnetic nanosystems | Funded as EXL04 |
| SRT-x2 | Solid-state single quantum particle metrology | Not funded |
| SRT-x3 | Measurement and control of single-photon microwave radiation on a chip | Funded as EXL03 |
| SRT-x4 | Nanoscale magnetic detection close to the quantum limit | Not funded |
| SRT-x5 | Quantum optomechanics and quantum enhanced ultra-high precision measurements | Not funded |
| SRT-x6 | Quantum engineered states for optical clocks and atomic sensors | Funded as EXL01 |
| SRT-x7 | Single-photon sources for quantum technologies | Funded as EXL02 |
| SRT-x8 | Advanced microscopy for multiparametric molecular imaging | Not funded |